Electronic components in electronic products we use daily life will also be aging. Some of these electronic components are due to a series of defects that may exist in the process of process manufacturing.
Such as the problems of the surface stains, poor lead welding, pipeline leakage, silicon wafer cracks, etc., the other part is that during our long use time, the electrical heating stress acceleration component is in the process of continuous use of the components. The process of chemical reactions causes the aging damage of electronic components.
Regardless of the situation, the aging of electronic components exists in all aspects of our lives. Therefore, for the aging of electronic components, its factory test is essential.
In the aging test of electronic components, we can test the electronic component automatic test system after accelerating the life of the metamopolytes, and test the electrical ginseng volume representing its performance degradation to obtain the test data to ensure the real -time and of the obtaining the data. Reliability, at the same time, can also test the functions and parameters of the components, such as automatic recognition polarity, maximum rectifier current, and positive pressure drop project test of diodes.
Through the test of these projects, on the one hand, our potential defects hidden inside the components can be exposed early, so as to achieve the purpose of eliminating early failure products. On the other hand The service life and overall performance of electronic components can be judged.
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